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Panasonic generates ideas for life...today and tomorrow. Through innovative thinking,
we are committed to enriching people's lives around the world.

Having the brand "Panasonic" in its name, Panasonic Semiconductor Discrete Devices (PSCDD) has a quality management policy, "Customer comes first & Manufacturing based on the fundamentals". This policy is the very fundamental of all PSCDD corporate activities.
To satisfy the increasingly diversified needs of modern society, We have newly added the three quality elements of S (safety and speed), M (morale), and E (environment) to the conventional three quality elements, which are Q (quality), C (cost), and D (delivery as scheduled). In a broad sense, We considers overall quality to consist of these six elements as product quality and is committed to quality improvements.
In addition to conventional quality management system, We have built superior quality management system that fully complies with the global quality standard (ISO/TS 16949:2002) that have been applied to the automotive manufacturing industry.
Adopting also the elements and philosophies of total quality management (TQM), We are committed to contributing to the improvement of corporate and organizational management in terms of quality enabling companies and organizations to be respected entities, and to establish an empathetic relationship with interested parties to share mind-evoking experiences.

Scanning Electron Microscope (SEM)

Scanning Electron Microscope (SEM)

Highly precise material analysis is indispensable for developing semiconductor chips. With a scanning electron microscope that features high resolution, we can realize high-quality semiconductor products by repeatedly performing qualitative and quantitative material analyses.
Focused Ion Beam System (FIB)

Focused Ion Beam System (FIB)

With a focused ion beam system, we can locate a product very accurately to the target position and observe its cross section by precisely irradiating a beam. This system is used to examine the cross section of wafers for failure analysis and for the check and control of semiconductor production processes.
Three-Dimensional Measuring Device

Three-Dimensional Measuring Device

A three-dimensional measuring device ensures the quality of injection-molded components as well as stamped components, including lead frames and combs.

ISO 9001 certification mark of Kyoto ISO 9001 certification mark of Kameoka ISO 9001 certification mark of Utsunomiya